• DocumentCode
    633419
  • Title

    Secondary-Ion-Mass Spectrometry and Refractive Index Profile Studies of Zn:Ni:LiNbO3 Optical Waveguides

  • Author

    Chiang, T.-Y. ; Liu, L.-Y. ; Tsai, W.S.

  • Author_Institution
    Dept. of Appl. Mater. & Optoelectron. Eng., Nat. Chi-Nan Univ., Nantou, Taiwan
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Optical waveguides of zinc and nickel co-diffused on lithium niobate substrates were measured with secondary-ion-mass spectrometry for metal ion concentrations and differential optical-fields for refractive index profiles. Correlation between compositional and optical properties was studied.
  • Keywords
    diffusion; integrated optics; lithium compounds; nickel; optical waveguides; refractive index; secondary ion mass spectra; zinc; LiNbO3; LiNbO3:Zn,Ni; codiffusion; compositional properties; differential optical-fields; lithium niobate substrates; metal ion concentrations; optical properties; optical waveguides; refractive index profile; secondary-ion-mass spectrometry; Optical device fabrication; Optical refraction; Optical variables control; Optical waveguides; Particle beam optics; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference held jointly with 2013 International Conference on Photonics in Switching (OECC/PS), 2013 18th
  • Conference_Location
    Kyoto
  • Type

    conf

  • Filename
    6597554
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=633419