DocumentCode
63371
Title
Dynamic Indexing: Leakage-Aging Co-Optimization for Caches
Author
Calimera, A. ; Loghi, Mirko ; Macii, E. ; Poncino, Massimo
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
Volume
33
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
251
Lastpage
264
Abstract
Traditional implementations of low-power states based on voltage scaling or power gating have been shown to have a beneficial effect on the aging phenomena caused by negative bias temperature instability (NBTI), which can be explained in terms of the intuitive correlation between the idleness and the reduced workload of a system. Such a joint benefit has been exploited only partially because of the different nature of energy and aging as cost functions: as a performance figure, aging is affected by the worst idleness pattern. Therefore, large potential energy savings usually result in limited aging reductions. In this paper, we address this problem in the context of power-managed caches, which represent a critical target for NBTI-reduced aging: given their symmetric structure, SRAM structures are, in particular, sensitive to NBTI effects because they cannot take advantage of the value-dependent recovery typical of NBTI. We propose a strategy called dynamic indexing, in which the cache indexing function is changed over time in order to uniformly distribute the idleness over all the various power managed units (e.g., lines). This distribution allows fully using the leakage optimization potential and extending the lifetime of a cache. We explore various alternatives, in particular different granularities of the power managed units as well as different reindexing functions. Experimental analysis shows that it is possible to simultaneously reduce leakage power and aging in caches, with minimal power consumption overhead.
Keywords
SRAM chips; ageing; cache storage; negative bias temperature instability; optimisation; NBTI effects; NBTI-reduced aging; SRAM structures; aging phenomena; aging reductions; cache indexing function; cache lifetime; dynamic indexing; leakage optimization potential; leakage-aging co-optimization; low-power states; negative bias temperature instability; power gating; power managed units; power-managed caches; reindexing functions; symmetric structure; value-dependent recovery; voltage scaling; worst idleness pattern; Aging; Computer architecture; Degradation; Indexing; Logic gates; Stress; Threshold voltage; Aging; caches; leakage power; memories; negative bias temperature instability (NBTI); reliability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2287187
Filename
6714506
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