DocumentCode :
634047
Title :
Effects of single-walled carbon nanotube defects and alignment angles on percolation conductivity in carbon nanotubes thin film
Author :
Berahman, M. ; Taheri, Meghdad ; Sheikhi, Mohammad Hossein ; Zarifkar, A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Shiraz Univ., Shiraz, Iran
fYear :
2013
fDate :
14-16 May 2013
Firstpage :
1
Lastpage :
4
Abstract :
Thin film carbon nanotubes have shown interesting potential for practical application such as sensors and transparent conductive films. However, lack of theoretical background on thin films and their dependency on CNTs properties prevent the progression of the technology in electronic. In this paper, based on the Monte-Carlo approach, we study the effects of nanotubes orientations and double vacancy on the percolation conductivity. We show that defects can decrease the film conductance. However, CNTs which are highly orientated will increase the conduction, significantly. CNTs alignment in specific direction may cause the film to reach the percolation threshold at higher values. Furthermore, we represent that, these values vary for different angles and orientations. These results can be implemented in practice, in order to provide the optimal conductance for single-walled carbon nanotube films.
Keywords :
Monte Carlo methods; carbon nanotubes; electrical conductivity; percolation; thin films; vacancies (crystal); C; Monte Carlo approach; alignment angle; carbon nanotube thin film; double vacancy; film conductance; percolation conductivity; percolation threshold; sensors; single walled carbon nanotube defect; transparent conductive film; Carbon nanotubes; Conductivity; Electrodes; Electron tubes; Films; Monte Carlo methods; Monte-Carlo simulation; alignment; defect; percolation; thin film carbon nanotubes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering (ICEE), 2013 21st Iranian Conference on
Conference_Location :
Mashhad
Type :
conf
DOI :
10.1109/IranianCEE.2013.6599543
Filename :
6599543
Link To Document :
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