Title :
A metric driven verification and validation approach for Smart Power devices
Author :
Melnychenko, Oleksandr ; Kreuter, Hans-Peter
Author_Institution :
Inst. of Comput. Eng., Vienna Univ. of Technol., Vienna, Austria
Abstract :
We propose a method for the pre-silicon metric driven verification and post-silicon validation of automotive Smart Power devices. The method is based on extending the UVM architecture with hardware drivers and monitors. We present the implementation of the hardware test bench components and the required software interfaces. The method is finally demonstrated by verifying a serial interface of a high-side power switch showing promising results.
Keywords :
automotive electronics; power electronics; switchgear; user interfaces; UVM architecture; automotive smart power devices; hardware drivers; hardware test bench components; high-side power switch; metric driven validation approach; postsilicon validation; presilicon metric driven verification; serial interface; software interfaces; Automotive engineering; Field programmable gate arrays; Hardware; Integrated circuit modeling; Measurement; Monitoring; Testing;
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on
Conference_Location :
Villach
Print_ISBN :
978-1-4673-4580-4
DOI :
10.1109/PRIME.2013.6603177