DocumentCode :
634452
Title :
Reviewers
fYear :
2013
fDate :
5-7 July 2013
Abstract :
The conference offers a note of thanks and lists its reviewers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biometrics and Kansei Engineering (ICBAKE), 2013 International Conference on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/ICBAKE.2013.75
Filename :
6603454
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=634452
