DocumentCode :
63464
Title :
Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop
Author :
Shih-Yi Yuan ; Yu-Lun Wu ; Perdriau, Richard ; Shry-Sann Liao
Author_Institution :
Dept. of Commun. Eng., Feng Chia Univ., Taichung, Taiwan
Volume :
55
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
299
Lastpage :
306
Abstract :
This paper presents a combined hardware-software mechanism for the detection of electromagnetic interference of a microcontroller (μC) in daily usage. This detection mechanism is based on the instability of phase-lock loop embedded in the target μC. It can detect the presence of EMI with higher sensitivity than polling the hardware status of the μC internal registers and thus provides a better detection margin within the 10 kHz to 1 GHz EMI frequency range. Despite its relative slowness and its resource consumption, it is very robust, can be implemented in virtually any application software, and does not require any electromagnetic compatibility test equipment.
Keywords :
electromagnetic compatibility; electromagnetic interference; microcontrollers; phase locked loops; μC internal registers; EMI; combined hardware-software mechanism; detection margin; detection mechanism; electromagnetic interference; embedded phase-lock loop; frequency 10 kHz to 1 GHz; microcontrollers; Clocks; Electromagnetic interference; Frequency measurement; Hardware; Phase locked loops; Registers; Software; Electromagnetic compatibility (EMC); electromagnetic radiation; near fields; phase-locked loops;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2012.2218285
Filename :
6341069
Link To Document :
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