Title :
Evaluating a low cost robustness improvement in SRAM-based FPGAs
Author :
Ben Jrad, Mohamed ; Leveugle, R.
Author_Institution :
TIMA Lab., UJF, Grenoble, France
Abstract :
Soft errors in the configuration memory of SRAM-based FPGAs cause significant application disturbances. We demonstrate on Xilinx and Altera FPGAs the feasibility of a very low cost and automated mitigation approach and we evaluate its efficiency.
Keywords :
SRAM chips; field programmable gate arrays; Altera FPGA; SRAM-based FPGA configuration memory; Xilinx FPGA; automated mitigation approach; low cost robustness improvement; soft errors; Decision support systems; Testing; SRAM-based FPGA; dependability; multiple errors; soft errors;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604072
