Title :
Ef3S: An evaluation framework for flash-based systems
Author :
Di Carlo, S. ; Galfano, S. ; Indaco, M. ; Prinetto, P.
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
Abstract :
NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.
Keywords :
NAND circuits; embedded systems; flash memories; performance evaluation; EF3S; NAND flash based memory system performances; computing system development; computing system performances; consumer-critical applications; electronic embedded systems; evaluation framework; flash-based systems; mission-critical applications; performance-reliability trade-offs; simulation engine; Ash; Error correction codes; File systems; Mathematical model; Nonvolatile memory; Reliability;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604079
