Title :
Binary-Level Testing of Embedded Programs
Author :
Bardin, Sabine ; Baufreton, Philippe ; Cornuet, Nicolas ; Herrmann, Patrick ; Labbe, Sebastien
Author_Institution :
LIST, CEA, Saclay, France
Abstract :
Dynamic Symbolic Execution (DSE) is a powerful approach to automatic test data generation. It has been heavily used in recent years for finding bugs in desktop programs. In this article, we discuss the use of binary-level DSE for testing safety-critical embedded systems. More especially, we present several innovative features implemented in our DSE tool OSMOSE, and we show through four case-studies how these features can be used in practical situations.
Keywords :
embedded systems; program compilers; program testing; safety-critical software; DSE tool OSMOSE; automatic test data generation; binary level DSE; binary level testing; desktop programs; dynamic symbolic execution; embedded programs; safety critical embedded systems; Aerodynamics; Cognition; Embedded systems; Search engines; Standards; Testing; automatic testing; binary-level analysis; symbolic execution;
Conference_Titel :
Quality Software (QSIC), 2013 13th International Conference on
Conference_Location :
Najing
DOI :
10.1109/QSIC.2013.49