DocumentCode :
635410
Title :
Semantic-Spatial Matching for image classification
Author :
Yupeng Yan ; Xinmei Tian ; Linjun Yang ; Yijuan Lu ; Houqiang Li
Author_Institution :
Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
1
Lastpage :
6
Abstract :
Spatial Pyramid Matching (SPM) has been proven a simple but effective extension to bag-of-visual-words image representation for spatial layout information compensation. SPM describes image in coarse-to-fine scale by partitioning the image into blocks over multiple levels and the features extracted from each block are concatenated into a long vector representation. Based on the assumption that images from the same class have similar spatial configurations, SPM matches the blocks from different images according to their spatial layout, by aligning all blocks from an image in a fixed spatial order. However, target objects may appear at any location in the image with various backgrounds. Therefore, the fixed spatial matching in SPM fails to match similar objects located different locations. To solve this problem, we propose an effective and efficient block matching method, Semantic-Spatial Matching (SSM). In this method, not only the spatial layout but also the semantic content is considered for block matching. The experiments on two benchmark image classification datasets demonstrate the effectiveness of SSM.
Keywords :
feature extraction; image classification; image matching; SPM matches; block matching method; feature extraction; fixed spatial matching; fixed spatial order; image classification datasets; image representation; semantic content; semantic spatial matching; spatial configurations; spatial layout information compensation; spatial pyramid matching; vector representation; Aerospace electronics; Feature extraction; Histograms; Kernel; Semantics; Vectors; Visualization; Spatial matching; bag-of-visual-words; image classification; semantic space;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2013 IEEE International Conference on
Conference_Location :
San Jose, CA
ISSN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2013.6607473
Filename :
6607473
Link To Document :
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