• DocumentCode
    635467
  • Title

    Unsupervised segmentation of focused regions in images with low depth of field

  • Author

    Rafiee, G. ; Dlay, S.S. ; Woo, Wai L.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Newcastle Univ., Newcastle upon Tyne, UK
  • fYear
    2013
  • fDate
    15-19 July 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Unsupervised extraction of focused regions from images with low depth-of-field (DOF) is a problem without an efficient solution yet. In this paper, we propose an efficient unsupervised segmentation solution for this problem. The proposed approach which is based on ensemble clustering and graph-cut modeling aims to extract meaningful focused regions from a given image at two stages. In the first stage, a novel two-level based ensemble clustering technique is developed to classify image blocks into three constituent classes. As a result, object and background blocks are extracted. By considering certain pixels of object and background blocks as seeds, a constraint is provided for the next stage of the approach. In stage two, a minimal graph cuts is constructed by utilizing the max-flow method and using object and background seeds. Experimental results demonstrate that the proposed approach achieves an average F-measure of 91.7% and is computationally up to 2 times faster than existing unsupervised approaches.
  • Keywords
    image classification; image segmentation; pattern clustering; average F-measure; depth of field; ensemble clustering; graph cut modeling; graph cuts; image block classification; max-flow method; unsupervised extraction; unsupervised segmentation solution; Abstracts; Educational institutions; Image resolution; Indexing; Xenon; Ensemble clustering; expectation-maximization algorithm; graph-cut optimization; interest regions segmentation; low depth-of-field;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2013 IEEE International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2013.6607604
  • Filename
    6607604