DocumentCode
635525
Title
Model-based test generation for software product line
Author
Xinying Cai ; Hongwei Zeng
Author_Institution
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai, China
fYear
2013
fDate
16-20 June 2013
Firstpage
347
Lastpage
351
Abstract
Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.
Keywords
program testing; SPLE; activity diagrams; domain engineering artifacts; domain test scenarios reusability; model-based test generation; software product line; variability description; variation points; Computational modeling; Software; Software algorithms; Software engineering; Testing; Unified modeling language; software product line; test reuse; test scenarios; variability binding;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Information Science (ICIS), 2013 IEEE/ACIS 12th International Conference on
Conference_Location
Niigata
Type
conf
DOI
10.1109/ICIS.2013.6607865
Filename
6607865
Link To Document