Title :
Model-based test generation for software product line
Author :
Xinying Cai ; Hongwei Zeng
Author_Institution :
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai, China
Abstract :
Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.
Keywords :
program testing; SPLE; activity diagrams; domain engineering artifacts; domain test scenarios reusability; model-based test generation; software product line; variability description; variation points; Computational modeling; Software; Software algorithms; Software engineering; Testing; Unified modeling language; software product line; test reuse; test scenarios; variability binding;
Conference_Titel :
Computer and Information Science (ICIS), 2013 IEEE/ACIS 12th International Conference on
Conference_Location :
Niigata
DOI :
10.1109/ICIS.2013.6607865
