DocumentCode :
636133
Title :
Effect of substrate temperature on SnS thin film deposition by nebulization technique
Author :
Karuppasamy, B. ; Amalraj, L. ; Gayathri, V.
Author_Institution :
Dept. of Phys., Thiagarajar Coll. of Eng., Madurai, India
fYear :
2013
fDate :
24-26 July 2013
Firstpage :
496
Lastpage :
498
Abstract :
Potential applications of thin films are well known, it strongly depends on the quality of the film. Several novel techniques are adopted for the fabrication. We have followed a completely newer technique using nebulizer for the film deposition. Substrate temperature (Ts) is one of the vital parameter that decides the nature of the film. Films were deposited for the range of Ts from 150 °C to 250 °C. The films were deposited with the precursor solution and Thiourea SC(NH2)2. The XRD data confirms that the films prepared are in polycrystalline nature containing the compounds of SnS2, Sn2S3 and SnS. The film prepared at 225 °C contains only SnS and the film at 250 °C contains SnS and SnO compounds. The indirect allowed band gap values for SnS thin film obtained from optical absorption measurements is 1.8 eV. Scanning Electron Microscope photographs conform that the films prepared by Nebulized spray technique are uniformly deposited without pinholes. The thickness and other physical parameters and possible technical applications of the film will be discussed in details.
Keywords :
IV-VI semiconductors; X-ray diffraction; energy gap; liquid phase deposition; scanning electron microscopy; semiconductor growth; semiconductor thin films; tin compounds; ultraviolet spectra; visible spectra; SnS; X-ray diffraction; XRD; indirect allowed band gap; nebulized spray technique; nebulizer; optical absorption measurement; physical parameters; polycrystalline nature; precursor solution; scanning electron microscopy; substrate temperature effect; temperature 150 degC to 250 degC; thickness parameters; thin film deposition; thiourea; ultraviolet-visible spectra; Absorption; Optical films; Optical imaging; Substrates; Tin; Nebulizer; Polycrystalline; Thin films; Tin sulphide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Nanomaterials and Emerging Engineering Technologies (ICANMEET), 2013 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4799-1377-0
Type :
conf
DOI :
10.1109/ICANMEET.2013.6609346
Filename :
6609346
Link To Document :
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