Title :
Sensitivity of MRI for directly detecting neuronal electrical activities in rat brain slices
Author :
Dongmin Kim ; Someya, Takao ; Sekino, Masaki
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
Abstract :
We developed an experimental setup for magnetic resonance imaging (MRI) of rat brain slices maintained in a hemoglobin-free medium and showed that the MRI system has a sensitivity to magnetic fields of 10-11 T. The originally developed non-magnetic sample holder consisted of a microelectrode array for recording neuronal potentials and perfusing channels for the medium. Because of the hemoglobin-free condition, the magnetic fields could be distinguished from the baseline signal fluctuations due to hemoglobin. A theoretical estimation of the signal-to-noise ratio showed a sensitivity of 3.3 × 10-10 T. Parameter optimization using a 7-T MRI system with the developed sample holder resulted in an experimental sensitivity of 4.0 × 10-10 T. These MRI sensitivities potentially enable us to detect weak magnetic fields arising from neuronal activities, and are sufficiently high for detecting neuronal magnetic fields of 1.4 × 10-11 T generated in rat brain slices by averaging signals 810 times.
Keywords :
biochemistry; bioelectric potentials; biomagnetism; biomedical MRI; brain; fluctuations; medical image processing; microelectrodes; molecular biophysics; neurophysiology; noise; parameter estimation; proteins; MRI system sensitivity; baseline signal fluctuation; channel perfusion; hemoglobin-free medium; magnetic flux density 7 T; magnetic resonance imaging; microelectrode array; neuronal electrical activity detection; neuronal magnetic field detection; neuronal potential recording; nonmagnetic sample holder; parameter optimization; rat brain slice; signal-to-noise ratio estimation; Brain; Coils; Magnetic fields; Magnetic resonance imaging; Sensitivity; Signal to noise ratio;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6609764