• DocumentCode
    636529
  • Title

    EEG source localization in full-term newborns with hypoxic-ischemia

  • Author

    Jennekens, W. ; Dankers, Frank ; Blijham, Paul ; Cluitmans, Pierre ; van Pul, C. ; Andriessen, Peter

  • Author_Institution
    Dept. of Med. Phys. & Technol., Maasstad Hosp., Rotterdam, Netherlands
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    3291
  • Lastpage
    3294
  • Abstract
    The aim of this study was to evaluate EEG source localization by standardized weighted low-resolution brain electromagnetic tomography (swLORETA) for monitoring of full-term newborns with hypoxic-ischemic encephalopathy, using a standard anatomic head model. Three representative examples of neonatal hypoxic-ischemia were included. The method was validated with MRI data. Hypoxic-ischemic areas, visible on MRI, correlated well with swLORETA current density distributions. In addition, neonatal seizure activity may be localized. The calculated current density distributions provide easy-to-interpret localized information about neonatal brain function, which may enable detailed longitudinal monitoring and potential assessment of treatment efficacy.
  • Keywords
    biomedical MRI; current density; diseases; electroencephalography; paediatrics; patient monitoring; physiological models; tomography; EEG source localization; MRI data; current density distribution calculation; full-term newborn monitoring; hypoxic ischemic area; hypoxic ischemic encephalopathy; longitudinal monitoring; neonatal brain function; neonatal hypoxic ischemia; neonatal seizure activity localization; standard anatomic head model; standardized weighted low resolution brain electromagnetic tomography; swLORETA; treatment efficacy assessment; Brain modeling; Current density; Electroencephalography; Head; Image segmentation; Magnetic resonance imaging; Pediatrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6610244
  • Filename
    6610244