DocumentCode
63670
Title
Combinatorial Reliability Analysis of Imperfect Coverage Systems Subject to Functional Dependence
Author
Liudong Xing ; Morrissette, Brock A. ; Dugan, Joanne Bechta
Author_Institution
Collaborative Autonomic Comput. Lab., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
63
Issue
1
fYear
2014
fDate
Mar-14
Firstpage
367
Lastpage
382
Abstract
Functional dependence occurs when the failure of one component causes other components within the same system to become inaccessible or unusable. It is one of the dynamic behaviors that have been recognized in the dynamic fault tree analysis, where a dynamic gate called FDEP was designed to model such behavior. Traditional approaches to handling functional dependence in the reliability analysis of fault-tolerant systems with imperfect fault coverage are mainly based on Markov models, which are often computationally intensive, and even intractable due to the well-known state space explosion problem. In addition, the Markov-based approaches are typically restricted to exponential time-to-failure distributions for system components. In this paper, a combinatorial, separable method based on the divide-and-conquer paradigm and total probability theorem is proposed for addressing the above problems. The proposed method obviates the use of inefficient Markov models, offering exact, computationally-efficient solutions to the reliability analysis of imperfect coverage systems subject to functional dependencies. The proposed method is applicable to the analysis of large systems with any arbitrary time-to-failure distributions. Several case studies are given to illustrate the application and advantages of the proposed method.
Keywords
Markov processes; combinatorial mathematics; divide and conquer methods; exponential distribution; failure analysis; fault tolerance; fault tolerant control; fault trees; reliability; state-space methods; FDEP; Markov models; Markov-based approaches; arbitrary time-to-failure distributions; combinatorial reliability analysis; combinatorial separable method; component failure; computationally-efficient solutions; divide-and-conquer paradigm; dynamic behaviors; dynamic fault tree analysis; dynamic gate; exponential time-to-failure distributions; fault-tolerant systems; functional dependence handling; imperfect coverage systems; reliability analysis; state space explosion problem; total probability theorem; Analytical models; Computational modeling; Discrete Fourier transforms; Fault trees; Logic gates; Markov processes; Reliability; Combinatorial approach; cascading effect; dynamic fault tree; functional dependence; imperfect coverage;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2014.2299431
Filename
6714531
Link To Document