Title :
Iterative image reconstruction for ultra-low-dose CT with a combined low-mAs and sparse-view protocol
Author :
Yunwan Zhang ; Jing Huang ; Jianhua Ma ; Hua Zhang ; Zhaoying Bian ; Dong Zeng ; Yang Gao ; Wufan Chen
Author_Institution :
Sch. of Biomed. Eng., Southern Med. Univ., Guangzhou, China
Abstract :
Ultra-low-dose x-ray computed tomography (CT) imaging is needed in CT fields. Through a scan protocol by lowering the milliampere-seconds (mAs) and reducing the number of projections per rotation around the body, we can realize low-dose CT imaging. However, the resulting noisy and insufficient measurements will unavoidably cause the degradation of desired-image. To solve this problem, iterative image reconstruction is a promising choice for achieving high-quality image with a low-dose scan. In this study, we are focusing on ultra-low-dose CT image reconstruction by using penalized weighted least-square (PWLS) criteria with a combined low-mAs and sparse-view protocol. Specifically, the sinogram data acquired with a combined low-mAs and sparse-view protocol is first restored by using a PWLS based sinogram restoration method. Then, the restored sinogram data is hereafter used to reconstruct image by using a PWLS based total variation (PWLS-TV) method. Qualitative and quantitative evaluations by simulations were carried out to validate the present method.
Keywords :
computerised tomography; data acquisition; image reconstruction; image restoration; least squares approximations; medical image processing; PWLS-TV; PWLS-based sinogram restoration method; PWLS-based total variation method; iterative image reconstruction; low-mAs protocol; sinogram data acquisition; sparse-view protocol; ultralow-dose CT image reconstruction; ultralow-dose X-ray computed tomography imaging; weighted least-square criteria; Computed tomography; Image reconstruction; Image restoration; Noise; Protocols; X-ray imaging;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6610697