DocumentCode :
636817
Title :
Development of perioperative glycemic control using an artificial endocrine pancreas
Author :
Hanazaki, Kazuhiro ; Namikawa, Tsutomu
Author_Institution :
Dept. of Surg., Kochi Univ., Nankoku, Japan
fYear :
2013
fDate :
3-7 July 2013
Firstpage :
5719
Lastpage :
5722
Abstract :
It is well known that tight glycemic control (TGC) in patients with diabetes mellitus is the most important to reduce complications, such as nephropathy, neuropathy, and retinopathy. Also, surgical stress induced hyperglycemia leading to glucose toxicity is the main cause of infectious complications after surgery. Recently perioperative TGC has been proven an effective method to reduce postoperative infectious complications and accelerate enhanced recovery after surgery (ERAS), with the main purpose of short staying hospital. However, conventional TGC with open-loop glycemic control system is likely to induce not only occurrence of hypoglycemia but also unstable glycemic control. To solve these problems, we have involved introduction of novel glycemic control using an artificial pancreas (AP) with closed-loop glycemic control system since 2006. To date, this novel perioperative glycemic control was performed in more than 400 surgical patients. As a result, we established stable and safe TGC using an AP to improve surgical outcomes without hypoglycemia. In this paper, we report current scientific evidence focusing on perioperative glycemic control using an AP.
Keywords :
artificial organs; diseases; sugar; surgery; artificial endocrine pancreas; diabetes mellitus; enhanced recovery after surgery; glucose toxicity; hypoglycemia; infectious complications; nephropathy; neuropathy; open loop glycemic control system; perioperative glycemic control; retinopathy; surgical stress induced hyperglycemia; tight glycemic control; Blood; Diabetes; Insulin; Pancreas; Stress; Sugar; Surgery;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2013.6610849
Filename :
6610849
Link To Document :
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