Title :
A method for actively tracking excitability of brain networks using a fully implantable monitoring system
Author :
Freestone, Dean R. ; Long, Sam N. ; Frey, Steffen ; Stypulkowski, Paul H. ; Giftakis, Jonathon E. ; Cook, Mark J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
Abstract :
This paper introduces a new method for estimating the excitability of brain networks. The motivation for this research was to develop a system that can track pathological changes in excitability, in diseases such as epilepsy. The ability to track excitability may provide a method for anticipating seizures and intervening therapeutically. Four normally healthy canines were implanted with the Medtronic Activia PC+S deep brain stimulation and sensing system. The devices were used to probe the circuit of Papez, with electrical stimulation in the anterior nucleus of the thalamus to measure evoked potentials in the hippocampus. The canines were given three different dosage levels of anti-convulsant medication in an attempt to manipulate the excitability of the network. The results showed changes in the morphology of the evoked potentials, following a circadian profile and reflecting times of drug delivery.
Keywords :
bioelectric potentials; biomedical electronics; biomedical equipment; brain; circadian rhythms; diseases; drug delivery systems; drugs; neurophysiology; patient monitoring; surgery; Medtronic Activia PC+S deep brain stimulation; Papez circuit; actively tracking excitability; anterior nucleus; anticonvulsant medication; brain networks; circadian profile; diseases; dosage levels; drug delivery; epilepsy; evoked potentials; fully implantable monitoring system; hippocampus; morphology; normally healthy canines; pathological changes; seizures; sensing system; thalamus; Drugs; Electrodes; Epilepsy; Feature extraction; Magnetic resonance imaging; Monitoring; Surgery;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6610957