DocumentCode
637421
Title
The calculation model of the shielding failure trip-out rate of double-circuit transmission line on the same tower
Author
Guangde Gao ; Haifei Wang ; Lintan Huang ; Shaofeng Zhao
Author_Institution
Electr. Eng. & Renewable Energy Sch., China Three Gorges Univ., Yichang, China
fYear
2012
fDate
18-20 Sept. 2012
Firstpage
1
Lastpage
5
Abstract
Electric geometry method(EGM) was used to calculate the shielding failure trip-out rate of double-circuit transmission line on the same tower in the thesis, with striking distance factor β that conforms to the height of tower changes being introduced and the lightning current obtained when the exposure arc was 0 being considered the strongest shielding failure current. Next analysis was made of effects of various factors like the ground inclined angle, tower structure and so forth on shielding failure trip-out rate of each phase conductor. Finally the calculation results showed as follows: the shielding failure trip-out rate increased first then decreased as the ground inclined angle increased; the shielding failure trip-out rate decreased as the horizontal interval between double shielding wires increased; the complicated relation between shielding failure trip-out rate and tower structure of each phase conductor indicated a respective calculation and analysis rather than a total shielding failure trip-out rate.
Keywords
cable shielding; conductors (electric); lightning; poles and towers; power transmission lines; EGM; calculation model; double circuit transmission line; electric geometry method; ground inclined angle; lightning current; phase conductor; shielding failure current; shielding failure trip-out rate; striking distance factor; tower structure; Conductors; Educational institutions; Equations; Lightning; Poles and towers; Power transmission lines; Wires; double circuit transmission line; electric geometry method (EGM); shielding failure trip-out rate; transmission line;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering and Automation Conference (PEAM), 2012 IEEE
Conference_Location
Wuhan
Print_ISBN
978-1-4577-1599-0
Type
conf
DOI
10.1109/PEAM.2012.6612525
Filename
6612525
Link To Document