DocumentCode :
637618
Title :
Unified charge model for short-channel junctionless double gate MOSFETs
Author :
Holtij, Thomas ; Graef, Michael ; Hain, Fabian ; Kloes, Alexander ; Iniguez, B.
Author_Institution :
Competence Center for Nanotechnol. & Photonics, Tech. Hochschule Mittelhessen, Giessen, Germany
fYear :
2013
fDate :
20-22 June 2013
Firstpage :
75
Lastpage :
80
Abstract :
A 2D physics-based model for short-channel junctionless double gate (DG) MOSFETs is presented. From a closed-form solution for the 2D potential we derive explicit equations for the calculation of threshold voltage VT and subthreshold slope S. A unified charge model valid for all operating regimes is developed by using Lambert´s W-function, and a standard smoothing function for the transition between depletion and accumulation region. The model for the potential is derived with the help of Poisson´s equation and the conformal mapping technique by Schwarz-Christoffel. Dependencies between the physical device parameters and their impact on the device performance are worked out. A comparison of our 2D physics-based model is done versus 2D TCAD Sentaurus simulation data.
Keywords :
MOSFET; Poisson equation; conformal mapping; electric charge; function approximation; 2D TCAD Sentaurus simulation data; 2D physics-based model; Lambert´s W-function; Poisson´s equation; Schwarz-Christoffel; accumulation region; closed-form solution; conformal mapping technique; depletion region; device performance; physical device parameters; short-channel junctionless double gate MOSFET; standard smoothing function; subthreshold slope; threshold voltage; unified charge model; Doping; Electric potential; Equations; Logic gates; Mathematical model; Semiconductor process modeling; Threshold voltage; 2D analytical modeling; Junctionless double gate MOSFET; conformal mapping; subthreshold slope; threshold voltage; unified charge model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location :
Gdynia
Print_ISBN :
978-83-63578-00-8
Type :
conf
Filename :
6613316
Link To Document :
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