DocumentCode
637627
Title
MTCA fast digitizer for direct RF measurements
Author
Habib, Samer Bou
Author_Institution
Insitute of Electron. Syst., Warsaw Univ. of Technol., Warsaw, Poland
fYear
2013
fDate
20-22 June 2013
Firstpage
118
Lastpage
122
Abstract
This paper describes the design of an Advanced Mezzanine Card (AMC) in the MTCA.4 standard suited for direct analog-to-digital conversion of high-frequency signals up to 2.7 GHz with a maximum ADC clock frequency of 800 MHz. Signal conversion is performed using the undersampling technique. This card was designed for the needs of different control and measurement systems of the FLASH and XFEL accelerators. The designed module consists of eight very-high-speed ADC channels, four high-speed and precision DAC channels, a powerful FPGA unit, fast SRAM memory, along with special power supply and diagnostic circuits. The AMC digitizer work in pair with various project-specific Rear Transition Modules (RTMs). This paper describes such issues as system organization allowing acquisition of data at such high rates as circuit synchronization by high-quality clock signals, as well as performance and usage of direct sampling of high frequency signals.
Keywords
SRAM chips; analogue-digital conversion; field programmable gate arrays; linear accelerators; radiofrequency measurement; ADC clock frequency; Advanced Mezzanine Card; DAC channels; FLASH accelerators; FPGA; MTCA fast digitizer; MTCA.4 standard; SRAM memory; XFEL accelerators; circuit synchronization; data acquisition; diagnostic circuits; direct RF measurements; direct analog-to-digital conversion; power supply; project-specific rear transition modules; signal conversion; undersampling technique; Bandwidth; Clocks; Demodulation; Field programmable gate arrays; Frequency measurement; Radio frequency; Synchronization; DAMC-DS800; HOM; KLM; LLRF; MTCA; direct sampling; fast ADC; field detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location
Gdynia
Print_ISBN
978-83-63578-00-8
Type
conf
Filename
6613325
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