Title :
Computer-aided detection of plagiarism in integrated-circuit layouts
Author :
Kasprowicz, D. ; Wada, Hiroyuki
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
While software detecting plagiarism in text or computer code is commonly used these days, no counterpart exists for integrated-circuit (IC) layouts. This paper proposes several criteria of IC-layout dissimilarity that can be used for computer-aided layouts matching. A program based on these criteria is shown to successfully identify similar layouts in a pool of designs.
Keywords :
circuit CAD; integrated circuit layout; IC layout; computer code; computer-aided detection; computer-aided layout matching; integrated-circuit layout; software detecting plagiarism; Computers; Eigenvalues and eigenfunctions; Integrated circuits; Layout; Measurement; Plagiarism; Transistors; copyright protection; integrated circuit; layout; plagiarism detection;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location :
Gdynia
Print_ISBN :
978-83-63578-00-8
