Title :
Tests of a readout front-end electronics for a pixel detector based on inverter amplifier
Author :
Kleczek, R. ; Grybos, Pawel
Author_Institution :
Dept. of Meas. & Electron., AGH Univ. of Sci. & Technol., Cracow, Poland
Abstract :
We report on the design and measurements of a prototype integrated circuit structure implemented in CMOS 180 nm technology and dedicated for readout of silicon pixel detectors. The prototype structure contains 16 channels, which are built of a charge sensitive amplifier and a main amplifier stage. We present both, the design procedure of the readout front-end electronics based on an inverter amplifier and the measurement results with the emphasis on the spread of analog parameters in the multichannel system. The single channel is characterized by: very low power dissipation level Pdiss = 10.4 μW, equivalent noise charge at the main amplifier output ENC = 95 e- rms at the peaking time tp = 70 ns and detector capacitance CDET = 100 fF. The charge sensitive amplifier and main amplifier stage have dimensions of 25 μm × 25 μm.
Keywords :
CMOS integrated circuits; amplifiers; integrated circuit design; integrated circuit testing; invertors; readout electronics; CMOS technology; analog parameters; capacitance 100 fF; charge sensitive amplifier; equivalent noise charge; inverter amplifier; main amplifier stage; multichannel system; pixel detector; power 10.4 muW; prototype integrated circuit structure; readout front end electronics; time 70 ns; Capacitance; Detectors; Inverters; Noise; Resistance; Shape measurement; Voltage measurement; CMOS front-end readout; low noise electronics;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location :
Gdynia
Print_ISBN :
978-83-63578-00-8