Title :
The dc measurement method of thermal resistance of IGBTs
Author :
Gorecki, Krzysztof ; Gorecki, Pawel
Author_Institution :
Dept. of Marine Electron., Gdynia Maritime Univ., Gdynia, Poland
Abstract :
In the paper the dc measurement method of thermal resistance of the IGBT is presented. The possibilities of selection of a thermally sensitive parameter and a manner of realization of the method are discussed. The correctness of the presented method was verified with the use of infrared measurements. The influence of the selected factors on the measurement error of the thermal resistance is analyzed.
Keywords :
insulated gate bipolar transistors; measurement errors; spectral methods of temperature measurement; thermal resistance measurement; DC measurement method; IGBT; infrared measurement; measurement error; thermal resistance; thermally sensitive parameter; Electrical resistance measurement; Integrated circuits; Semiconductor device measurement; Temperature measurement; Thermal resistance; Voltage measurement; IGBT; measurements; thermal resistance;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location :
Gdynia
Print_ISBN :
978-83-63578-00-8
