DocumentCode
637724
Title
Beam intensity measurements in the Large Hadron Collider
Author
Krupa, Michal ; Soby, Lars
Author_Institution
CERN, Geneva, Switzerland
fYear
2013
fDate
20-22 June 2013
Firstpage
592
Lastpage
597
Abstract
The number of particles in the particle beam, commonly referred to as beam intensity, is a crucial parameter for safe and efficient operation of any particle accelerator. The Large Hadron Collider (LHC) is equipped with current transformers which measure the electric current of the beam used to derive the beam intensity. There are two types of current transformers installed in the LHC. The DC Current Transformers (DCCTs) measure direct current signals whereas the bandwidth of the Fast Beam Current Transformers (FBCTs) ranges from a few hundred hertz to over a gigahertz. Throughout the run of the LHC, the FBCTs´ readings were observed not to be fully independent of beam position and bunch length which imposes important limitations. To address these limitations a prototype of an Integrating Current Transformer (ICT) has been developed at CERN. In this paper, its design, principle of operation along with results of first beam tests are presented. The paper describes also the measures taken to install and test the prototype with LHC beams. The measured beam-position-dependency of the ICT has been improved, compared to the FBCT, by factors 35 and 50 in the vertical and horizontal planes, respectively.
Keywords
beam handling techniques; current transformers; particle accelerators; particle beam diagnostics; DC current transformers; Large Hadron Collider; beam intensity measurements; beam-position-dependency; electric current; fast beam current transformers; integrating current transformer; particle accelerator; particle beam; Current measurement; Current transformers; Large Hadron Collider; Magnetic cores; Particle beam measurements; Particle beams; Prototypes; Beam diagnostics; Fast Beam Current Transformer (FBCT); Integrating Current Transformer (ICT); beam intensity measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
Conference_Location
Gdynia
Print_ISBN
978-83-63578-00-8
Type
conf
Filename
6613422
Link To Document