Title :
Security analysis of smart grids-A complex network perspective
Author :
Youwei Jia ; Zhao Xu ; Siu-Lau Ho ; Zheng Xiong Feng ; Loi Lei Lai
Author_Institution :
Dept. of Electr. Eng., Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
Complex network theory is useful and effective in analyzing power system security because of increased complexities and uncertainties in smart grid development. Traditional complex network models based on topological structure is unable to address some important electrical properties of power grids. Therefore, such models have many limitations when assessing the vulnerability of power grids and cannot analyze smart grids with cyber-physical dynamics. In this paper, a new approach based on the power adjacency matrix (PAM) is proposed to perform security assessment of power grids by taking into account not only the topological connection of the physical network, but also the efficiency of power flow on each edge. Vulnerability analysis is carried out by introducing PAM, the updating process of which can primarily describe the trends of electrical network dynamics. Finally, a case study (IEEE 118 bus system) is conducted based on both traditional and proposed models. Simulation results show that the proposed PAM based approach is very reasonable and precise for structural vulnerability analysis on power networks.
Keywords :
IEEE standards; power system security; smart power grids; IEEE 118 bus system; PAM based approach; complex network models; complex network perspective; complex network theory; cyber-physical dynamics; electrical network dynamics; electrical properties; physical network; power adjacency matrix; power grids; power networks; power system security; security analysis; security assessment; smart grids; structural vulnerability analysis; topological structure; complex networks; power adjacency matrix; security; vulnerability;
Conference_Titel :
Advances in Power System Control, Operation and Management (APSCOM 2012), 9th IET International Conference on
Conference_Location :
Hong Kong
Electronic_ISBN :
978-1-84919-743-4
DOI :
10.1049/cp.2012.2143