Title :
Temperature distribution measurement by using off-axis digital holographic microscopy
Author :
Tserendolgor, D.
Author_Institution :
Mongolian Univ. of Sci. & Technol., Ulaanbaatar, Mongolia
fDate :
June 28 2013-July 1 2013
Abstract :
Wedescribe a single-shot off-axis digital holographic microscopy based on a Michelson interferometric scheme for measuring temperature distribution of a microheater. The temperature variation of the microheater substrate can result in the refractive index change. Therefore, the temperature can be obtained by detecting of reconstructing object phase image, which is dependent of the temperature distribution in real time. The experimental results demonstrate the feasibility and effectiveness of the off-axis digital holography in various surface temperature distribution measurement applications.
Keywords :
Michelson interferometers; holographic interferometry; image reconstruction; refractive index; temperature distribution; Michelson interferometric scheme; microheater substrate; reconstructed object phase image; refractive index change; single-shot off-axis digital holographic microscopy; temperature distribution measurement; Arrays; Charge coupled devices; Microscopy;
Conference_Titel :
Strategic Technology (IFOST), 2013 8th International Forum on
Conference_Location :
Ulaanbaatar
Print_ISBN :
978-1-4799-0931-5
DOI :
10.1109/IFOST.2013.6616935
