Title :
Analysis of IMC evolution and nickel plating consumption of SAC305/Ni soldering joints
Author :
Wang Jian-hua ; Meng Gong-ge
Author_Institution :
Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China
fDate :
June 28 2013-July 1 2013
Abstract :
The study is about the interfacial intermetallic compounds (IMC) microscopic changes and nickel plating consumption on SAC305/Ni soldering joints (with four solder diameters: 200, 300, 400, 500μm) before and after isothermal aging at 160°C by scanning electron microscopy (SEM). The results indicated that the IMC are mainly the (Cu, Ni)6Sn5 of SAC305/Ni soldering joints after reflow. After aging, the thickness of IMC layer increases, and the larger the soldering joint size, the greater the IMC growth rate. After reflow and aging, the thickness of interfacial IMC layer is thinning with the increasing of the soldering joint size. The remaining thickness of nickel plating is thinning with the aging time prolonging. After reflow, the remaining nickel plating is thinner with the increase of the soldering joint size. After aging 96-600h, with the increase of the soldering size, the remaining thickness of the nickel plating layer is thicker.
Keywords :
ageing; electroplating; nickel; printed circuit manufacture; reflow soldering; scanning electron microscopy; IMC evolution; IMC growth rate; SAC30-nickel soldering joints; SEM; interfacial intermetallic compounds; isothermal aging; nickel plating consumption; reflow soldering; scanning electron microscopy; Compounds; Educational institutions; Nickel; Software; Software measurement; Software reliability; Tin; SAC305; aging; intermetallic compounds; nickel plate;
Conference_Titel :
Strategic Technology (IFOST), 2013 8th International Forum on
Conference_Location :
Ulaanbaatar
Print_ISBN :
978-1-4799-0931-5
DOI :
10.1109/IFOST.2013.6616960