Title :
Dual Fluorescence-Activated Study of Tumor Cell Apoptosis by an Optofluidic System
Author :
Jinhong Guo ; Xing Ma ; Menon, Nishanth V. ; Chang Ming Li ; Yanli Zhao ; Yuejun Kang
Author_Institution :
Sch. of Chem. & Biomed. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
We have developed a planar optofluidic chip for the analysis of tumor cell apoptosis by exciting dual fluorescence through the integrated fibers. In contrast to conventional cell apoptosis study that requires commercial flow cytometer with a very high price tag and bulky optics, our design was realized via a simple single-layer soft lithography fabrication process. The device performance was tested by characterizing the HeLa cell apoptosis induced by hydrogen peroxide. The performance of the proposed optofluidic chip was concurrently confirmed by fluorescent microscopy and benchmarked against a commercial flow cytometer. This study demonstrated the capability of the proposed optofluidic chip for cell apoptosis assay. The major advantages of this device include simple fabrication process, compact optical components, reliable performance, and low manufacturing cost, making it a promising platform for future mass-producible, inexpensive, and disposable on-chip investigation of biological samples.
Keywords :
biomedical equipment; cellular biophysics; fluorescence; optical fibres; optical microscopy; soft lithography; tumours; HeLa cell apoptosis; biological samples; commercial flow cytometer; compact optical components; dual fluorescence-activated study; flow cytometer; fluorescent microscopy; hydrogen peroxide; integrated fibers; optofluidic system; planar optofluidic chip; simple single-layer soft lithography fabrication; tumor cell apoptosis analysis; Fluorescence; Focusing; Green products; Hydrodynamics; Microfluidics; Optical fiber devices; Optical fibers; Dual floourescene; Optofluidics; Optofluidics Cytometry; Tumor cell apoptosis; cytometry; dual fluorescence; tumor cell apoptosis;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2014.2331960