Title :
Cone of influence and constants propgation reduction techniques for MDG model checker
Author_Institution :
Electr. & Comput. Eng. Dept., Concordia Univ. Montreal Canada, Montreal, QC, Canada
Abstract :
Sizes and complexity of modern design models has become the main challenges that can limit the model checking process due to the state explosion problem. Applying reduction techniques on complex modern system models to reduce their sizes, obtain relevant parts, and basically constructing such simplification for the model checking process can lead to verify those complex models. While Multiway Decision Graphs model checker (MDG-MC) has great advantages of using abstract variables and uninterpreted function symbols to describe sets of states and transition relations that increase the functional domain of MDG-MC, the state explosion problem is still the main limitation that prevents MDG-MC from verifying real modern designs. In this paper, and to alleviate the state explosion problem, we introduce a simple but powerful Cone of Influence and constants propagation reduction techniques to improve the efficiency of verification process of MDG-MC. The preliminary experimental results confirm that the reduction in model checking time and memory size can be dramatic, thereby allowing for the verification of hitherto intractable systems.
Keywords :
formal verification; MDG model checker; MDG-MC; abstract variables; complex modern system models; constant propagation reduction techniques; design model complexity; design model size; influence cone; memory size reduction; model checking process; model checking time reduction; multiway decision graph model checker; state explosion problem; states relation; transition relations; uninterpreted function symbols; Abstracts; Boolean functions; Data structures; Explosions; Integrated circuit modeling; Model checking; Reduced order systems; COI model reduction; Formal verification; Model checking; Multiway Decision Graphs;
Conference_Titel :
Computer and Information Technology (WCCIT), 2013 World Congress on
Conference_Location :
Sousse
Print_ISBN :
978-1-4799-0460-0
DOI :
10.1109/WCCIT.2013.6618673