DocumentCode :
639466
Title :
Learning for Structured Prediction Using Approximate Subgradient Descent with Working Sets
Author :
Lucchi, Aurelien ; Yunpeng Li ; Fua, Pascal
fYear :
2013
fDate :
23-28 June 2013
Firstpage :
1987
Lastpage :
1994
Abstract :
We propose a working set based approximate sub gradient descent algorithm to minimize the margin-sensitive hinge loss arising from the soft constraints in max-margin learning frameworks, such as the structured SVM. We focus on the setting of general graphical models, such as loopy MRFs and CRFs commonly used in image segmentation, where exact inference is intractable and the most violated constraints can only be approximated, voiding the optimality guarantees of the structured SVM´s cutting plane algorithm as well as reducing the robustness of existing sub gradient based methods. We show that the proposed method obtains better approximate sub gradients through the use of working sets, leading to improved convergence properties and increased reliability. Furthermore, our method allows new constraints to be randomly sampled instead of computed using the more expensive approximate inference techniques such as belief propagation and graph cuts, which can be used to reduce learning time at only a small cost of performance. We demonstrate the strength of our method empirically on the segmentation of a new publicly available electron microscopy dataset as well as the popular MSRC data set and show state-of-the-art results.
Keywords :
Markov processes; gradient methods; graph theory; image segmentation; inference mechanisms; learning (artificial intelligence); random processes; support vector machines; CRFs; MSRC data set; Markov random fields; approximate inference techniques; belief propagation; conditional random fields; convergence property; electron microscopy dataset; exact inference; graph cuts; graphical models; image segmentation; loopy MRFs; margin-sensitive hinge loss minimization; max-margin learning frameworks; structured SVM cutting plane algorithm; structured prediction learning; working set based approximate subgradient descent algorithm; Approximation algorithms; Convergence; Fasteners; Image segmentation; Inference algorithms; Labeling; Training; computer vision; electron microscopy; image segmentation; machine learning; structured prediction; subgradient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2013 IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2013.259
Filename :
6619103
Link To Document :
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