DocumentCode :
639695
Title :
Large breakdown field and dielectric performance of CaCu3Ti4O12 ceramics modified by Al2O3
Author :
Ran Jia ; Xian Tang ; Jianying Li ; Xuetong Zhao
Author_Institution :
State Key Lab. of Electr. In sulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2013
fDate :
June 30 2013-July 4 2013
Firstpage :
1087
Lastpage :
1090
Abstract :
CaCu3Ti4O12 ceramics samples with varied Al2O3 additions have been prepared by a dispersion-precipitation-sintering method. The ceramics with nominal addition of 8 wt% Al2O3 sintered at 1100°C for 4 hours shows a breakdown electric field Eb of 21 kV/cm, compared with reported values of 1.0~2.0 kV/cm. Three energy levels of dielectric relaxation, two of which do not vary with either second phase addition or sintering condition, are found. The nearly constant levels of ~0.13 eV and ~0.33 eV are considered to relate to bulk and domain boundary relaxations. Another level varied from 0.61 to 0.84 eV is suggested to be Maxwell-Wagner relaxation of grain boundary, which correlates well with breakdown electric field Eb. It was proposed that the enhanced breakdown field is attributed to higher energy level of grain boundary relaxation and CuAl2O4 aggregation in the intergranular region.
Keywords :
aluminium compounds; calcium compounds; ceramics; copper compounds; disperse systems; electric breakdown; grain boundaries; precipitation; sintering; titanium compounds; CaCu3Ti4O12-Al2O3; Maxwell-Wagner relaxation; breakdown electric field; dielectric performance; dielectric relaxation; dispersion-precipitation-sintering method; domain boundary relaxations; electron volt energy 0.61 eV to 0.84 eV; energy level; grain boundary relaxation; intergranular region; phase addition; sintering condition; temperature 1100 degC; Aluminum oxide; Ceramics; Dielectrics; Electric breakdown; Energy states; Grain boundaries; Solids; CaCu3Ti4O12 ceramics; becond phase; bielectric performance; breakdown field;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
ISSN :
2159-1687
Print_ISBN :
978-1-4799-0807-3
Type :
conf
DOI :
10.1109/ICSD.2013.6619878
Filename :
6619878
Link To Document :
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