Title :
Variable-length coding with feedback: Finite-length codewords and periodic decoding
Author :
Tsung-Yi Chen ; Williamson, Adam R. ; Wesel, Richard D.
Author_Institution :
Dept. of Electr. Eng., UCLA, Los Angeles, CA, USA
Abstract :
Theoretical analysis has long indicated that feedback improves the error exponent but not the capacity of single user memoryless channels. Recently Polyanskiy et al. studied the benefit of variable-length feedback with termination (VLFT) codes in the non-asymptotic regime. In that work, achievability is based on an infinite-length random code and decoding is attempted at every symbol. The coding rate backoff from capacity due to channel dispersion is greatly reduced with feedback, allowing capacity to be approached with surprisingly small expected latency. This paper is concerned with VLFT codes based on finite-length codes and decoding attempts only at certain specified decoding times. Note that with an underlying finite-length code, the transmitter may have to repeat code symbols. The penalties of using a finite block-length N and a sequence of specified decoding times are studied. This paper shows that properly scaling N with the expected latency can achieve the same performance up to second order terms as with N =∞. The penalty introduced by limiting the decoding is a constant term and hence the performance approaches capacity as expected latency increases as long as the interval between periodic decoding times grows sub-linearly with the expected latency.
Keywords :
channel capacity; channel coding; decoding; feedback; random codes; variable length codes; VLFT codes; channel dispersion; code symbols; coding rate backoff; finite block-length; finite-length codewords; infinite-length random code; periodic decoding; single user memoryless channel capacity; transmitter; variable-length feedback with termination codes; Automatic repeat request; Decoding; Encoding; Error probability; Memoryless systems; Throughput;
Conference_Titel :
Information Theory Proceedings (ISIT), 2013 IEEE International Symposium on
Conference_Location :
Istanbul
DOI :
10.1109/ISIT.2013.6620686