• DocumentCode
    640842
  • Title

    Charge transport under microwave irradiation in Josephson heterostrucrures superconductor - doped semiconductor - superconductor

  • Author

    Shaternik, V. ; Shapovalov, Anton ; Suvorov, Alexander ; Doring, S. ; Schmidt, Signe ; Seidel, P.

  • Author_Institution
    G. Kurdumov Inst. for Metal Phys., Kyiv, Ukraine
  • fYear
    2013
  • fDate
    23-28 June 2013
  • Firstpage
    655
  • Lastpage
    657
  • Abstract
    Molybdenum-rhenium (MoRe) alloy based Josephson junction with various transparency distribution functions have been fabricated and studied. MoRe-Si(doped by tungsten)-MoRe junctions have been fabricated by using thin films deposition techniques. Bottom MoRe electrodes with a thickness of about 100 nm have been fabricated by magnetron sputtering in argon atmosphere. Silicon (Si) barriers doped by tungsten (W) have been fabricated by magnetron sputtering in argon atmosphere with the use of a complicated target assembled from a pure silicon wafer and a number of tungsten wires. Top MoRe electrodes with a thickness of about 100 nm have been fabricated by magnetron sputtering as well. Current-voltage characteristics (I-V curves) of the fabricated Josephson junctions have been measured at various temperature and magnetic field values.
  • Keywords
    argon compounds; charge exchange; molybdenum compounds; rhenium compounds; semiconductor doping; silicon compounds; sputter deposition; superconducting junction devices; superconducting semiconductors; thin film devices; tungsten compounds; I-V curves; Josephson heterostructures superconductor; MoRe electrodes; argon atmosphere; charge transport; current-voltage characteristics; doped semiconductor-superconductor; magnetic field values; magnetron sputtering; microwave irradiation; molybdenum-rhenium alloy based Josephson junction; pure silicon wafer; silicon barriers; temperature values; thin films deposition techniques; transparency distribution functions; tungsten wires; Josephson junctions; Junctions; Resonant tunneling devices; Silicon; Superconducting microwave devices; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2013 International Kharkov Symposium on
  • Conference_Location
    Kharkiv
  • Print_ISBN
    978-1-4799-1066-3
  • Type

    conf

  • DOI
    10.1109/MSMW.2013.6622164
  • Filename
    6622164