DocumentCode :
641323
Title :
Defect detection algorithm for high speed inspection in machine vision
Author :
Iyshwerya, K. ; Janani, B. ; Krithika, S. ; Manikandan, T.
Author_Institution :
ECE, Rajalakshmi Eng. Coll., Chennai, India
fYear :
2013
fDate :
28-29 March 2013
Firstpage :
103
Lastpage :
107
Abstract :
Machine vision (MV) is a technique used to provide image based automatic inspection and analysis for applications such as inspection and process control. This paper aims to implement a real time defect detection algorithm for high speed inspection using machine vision for a Mild Steel (MS) welding chip. The performance of the existing defect detection algorithms available for MS welding chips fails due to various noises like thermal noise and digitizing noise. The proposed algorithm aims to reduce the noise efficiently by pre-filtering and post-filtering methods. The MS welding chip is in the form of a cylindrical disc. This paper also considers the effect of lightening. The image is acquired from a progressive scan camera and Quartz Tungsten lighting is used. Thus by using all these techniques, the experimental results show that the proposed algorithm is suitable to the condition of the real time processing and accuracy of detection process in Machine Vision was found to be 96.31%.
Keywords :
cameras; computer vision; filtering theory; inspection; process control; production engineering computing; quartz; steel; welding; MS welding chip; cylindrical disc; defect detection algorithm; defect detection algorithms; detection process; digitizing noise; high speed inspection; image based automatic analysis; image based automatic inspection; lightening effect; machine vision; mild steel welding chip; post-filtering methods; prefiltering methods; process control; progressive scan camera; quartz tungsten lighting; real time processing; thermal noise; Image edge detection; Tungsten; Welding; Defect detection; High speed inspection; LABVIEW; Prewitt filter; Real-time image processing; Thresholding Local averaging filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Smart Structures and Systems (ICSSS), 2013 IEEE International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4673-6240-5
Type :
conf
DOI :
10.1109/ICSSS.2013.6623010
Filename :
6623010
Link To Document :
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