Title :
A method to reduce sensitivity of fabrication errors in design of proximity-coupled cavity-backed stacked patches antenna
Author :
Dan Sun ; Wenbin Dou ; Zhaocheng Zhang
Author_Institution :
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing, China
Abstract :
A broadband proximity-coupled stacked patches antenna with backed cavity which has the low sensitivity of fabrication errors is presented. By adding two copper strips on the reverse side of the feed-line, the influence of the relative displacement between the feed layers and the cavity on the bandwidth performance of the antenna can be reduced. With this method, the antenna can bear the relatively larger tolerances without the significant modification in the original proximity-coupled cavity-backed stacked patches antenna. Furthermore, it still retains a good broadband property. The simulated bandwidth of the antenna exceeds 40% (VSWR<;2), and it have the nice radiation patterns.
Keywords :
antenna feeds; antenna radiation patterns; broadband antennas; copper; microstrip antennas; backed cavity; broadband property; broadband proximity-coupled stacked patches antenna; copper strip; fabrication error; feed-line; proximity-coupled cavity-backed stacked patches antenna; radiation pattern; relative displacement; sensitivity reduction; Broadband microstrip patch antenna; cavity-backed; proximity-coupling; stacked patches;
Conference_Titel :
Radar Conference 2013, IET International
Conference_Location :
Xi´an
Electronic_ISBN :
978-1-84919-603-1
DOI :
10.1049/cp.2013.0443