• DocumentCode
    642071
  • Title

    Generalized analysis of processes parameters measurement in SQM

  • Author

    Palchun, Yu.A. ; Serykh, V.I. ; Yakimova, I.V. ; Kvitkova, I.G.

  • fYear
    2012
  • fDate
    2-4 Oct. 2012
  • Firstpage
    125
  • Lastpage
    126
  • Abstract
    Based on the generalized model of measurement main equations for process measurement in SQM are obtained.
  • Keywords
    measurement; production engineering computing; quality management; SQM; process parameters measurement; software quality management; Conferences; Equations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4673-2842-5
  • Type

    conf

  • DOI
    10.1109/APEIE.2012.6628973
  • Filename
    6628973
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=642071