Title :
A simple extraction procedure for determining the electrical parameters in Silicon Photomultipliers
Author :
Giustolisi, G. ; Palumbo, Gaetano ; Finocchiaro, Paolo ; Pappalardo, Alfio
Author_Institution :
DIEEI, Univ. di Catania, Catania, Italy
Abstract :
The Silicon Photomultiplier (SiPM) is a promising kind of device able to handle single photons thus permitting the measurement of weak optical signals. The design of a highperformance front-end electronics for the read-out, requires an accurate electrical model of the SiPM. A reliable model was developed in the past but the parameter extraction procedure is rather cumbersome and requires several measurement steps. In this communication we present a simple extraction procedure that can be performed with two simple measurement steps. The extraction procedure is applied to a 10×10 SiPM and is validated by comparing the equivalent spice model to measurement results.
Keywords :
elemental semiconductors; optical variables measurement; photomultipliers; photons; readout electronics; reliability; silicon; Si; SiPM; electrical parameter; equivalent spice model; front-end electronics; parameter extraction procedure; photon; read-out electronics; reliability model; silicon photomultiplier; weak optical signal measurement; Capacitors; Integrated circuit modeling; Photomultipliers; Photonics; Resistors; Silicon; Voltage measurement;
Conference_Titel :
Circuit Theory and Design (ECCTD), 2013 European Conference on
Conference_Location :
Dresden
DOI :
10.1109/ECCTD.2013.6662194