DocumentCode :
64271
Title :
Integrating Random Shocks Into Multi-State Physics Models of Degradation Processes for Component Reliability Assessment
Author :
Yan-Hui Lin ; Yan-Fu Li ; Zio, Enrico
Author_Institution :
Dept. on Syst. Sci. & the Energetic Challenge, Ecole Centrale Paris-Supelec, Gif-sur-Yvette, France
Volume :
64
Issue :
1
fYear :
2015
fDate :
Mar-15
Firstpage :
154
Lastpage :
166
Abstract :
We extend a multi-state physics model (MSPM) framework for component reliability assessment by including semi-Markov and random shock processes. Two mutually exclusive types of random shocks are considered: extreme, and cumulative. Extreme shocks lead the component to immediate failure, whereas cumulative shocks simply affect the component degradation rates. General dependences between the degradation and the two types of random shocks are considered. A Monte Carlo simulation algorithm is implemented to compute component state probabilities. An illustrative example is presented, and a sensitivity analysis is conducted on the model parameters. The results show that our extended model is able to characterize the influences of different types of random shocks onto the component state probabilities and the reliability estimates.
Keywords :
Markov processes; Monte Carlo methods; estimation theory; probability; reliability theory; sensitivity analysis; shock waves; MSPM framework; Monte Carlo simulation algorithm; component degradation rate; component reliability assessment; component state probability; degradation process; model parameter; multistate physics model framework; random shock process; random shocks; reliability estimate; semiMarkov process; sensitivity analysis; Biological system modeling; Degradation; Electric shock; Maintenance engineering; Monte Carlo methods; Physics; Reliability; Component degradation; Monte Carlo simulation; multi-state physics model; random shocks; semi-Markov process;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2014.2354874
Filename :
6895190
Link To Document :
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