• DocumentCode
    64271
  • Title

    Integrating Random Shocks Into Multi-State Physics Models of Degradation Processes for Component Reliability Assessment

  • Author

    Yan-Hui Lin ; Yan-Fu Li ; Zio, Enrico

  • Author_Institution
    Dept. on Syst. Sci. & the Energetic Challenge, Ecole Centrale Paris-Supelec, Gif-sur-Yvette, France
  • Volume
    64
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    154
  • Lastpage
    166
  • Abstract
    We extend a multi-state physics model (MSPM) framework for component reliability assessment by including semi-Markov and random shock processes. Two mutually exclusive types of random shocks are considered: extreme, and cumulative. Extreme shocks lead the component to immediate failure, whereas cumulative shocks simply affect the component degradation rates. General dependences between the degradation and the two types of random shocks are considered. A Monte Carlo simulation algorithm is implemented to compute component state probabilities. An illustrative example is presented, and a sensitivity analysis is conducted on the model parameters. The results show that our extended model is able to characterize the influences of different types of random shocks onto the component state probabilities and the reliability estimates.
  • Keywords
    Markov processes; Monte Carlo methods; estimation theory; probability; reliability theory; sensitivity analysis; shock waves; MSPM framework; Monte Carlo simulation algorithm; component degradation rate; component reliability assessment; component state probability; degradation process; model parameter; multistate physics model framework; random shock process; random shocks; reliability estimate; semiMarkov process; sensitivity analysis; Biological system modeling; Degradation; Electric shock; Maintenance engineering; Monte Carlo methods; Physics; Reliability; Component degradation; Monte Carlo simulation; multi-state physics model; random shocks; semi-Markov process;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2014.2354874
  • Filename
    6895190