Title :
Model structures with wavelet basis functions
Author :
Mukhopadhyay, Saibal ; Mukherjee, Dipankar ; Tiwari, Akhilanand P.
Author_Institution :
Control Instrum. Div., Bhabha Atomic Res. Centre, Mumbai, India
Abstract :
The paper addresses formalization of discrete model structures in a simulation/ predictive framework with generalized basis functions and in particular with wavelet basis functions. In deviation from traditional methods that develop models in terms of sampled data, the model directly relates wavelet projections of data thereby effectively utilizing the benefits offered by wavelet basis functions. Nonlinear estimate of output from sparse representation in wavelet domain is synthesized by alternate projection that converges to minimum norm solution. Two industry applications are discussed - one pertaining to the problem of modeling Liquid Zone Control System (LZCS) in a large Pressurized Heavy Water Reactor (PHWR) and the other for identifying an inverse map for defect profile estimation from magnetic flux leakage signal. In both these studies, sub-band linear time invariant or time varying models are identified using the method of consistent output estimation. The resulting models exhibit remarkable estimation capabilities and highlight the advantages of using consistent estimation for identification.
Keywords :
heavy water reactors; level control; magnetic flux; nonlinear estimation; nuclear power stations; power generation control; predictive control; signal processing; time-varying systems; wavelet transforms; LZCS; PHWR; consistent output estimation method; data wavelet projections; discrete model structure formalization; generalized basis functions; inverse map identification; liquid zone control system modeling problem; magnetic flux leakage signal; nonlinear output estimation; predictive framework; pressurized heavy water reactor; profile estimation defect; simulation framework; subband linear time invariant model; time varying model; wavelet basis functions; Discrete wavelet transforms; Estimation; Multiresolution analysis; Predictive models; Signal resolution;
Conference_Titel :
Control Applications (CCA), 2013 IEEE International Conference on
Conference_Location :
Hyderabad
DOI :
10.1109/CCA.2013.6662785