A new recognition algorithm with high result reliability

Author

Xiaoyu Liu ; Zhongyuan Yu ; Yumin Liu ; Houjian Kang ; Jinhong Mu

Author_Institution

State Key Lab. of Inf. Photonics & Opt. Commun., Beijing Univ. of Posts & Telecommun., Beijing, China

Volume

02

fYear

2012

fDate

Oct. 30 2012-Nov. 1 2012

Firstpage

932

Lastpage

935

Abstract

High recognition rate is the aim of pattern recognition, which is difficult to obtain without ideal feature extraction. To solve this problem, a new recognition algorithm with high result reliability is proposed. The core contents of this algorithm are MSCM (multiple-set-compete method) and the algorithm of result reliability. In this paper, MSCM improving the recognition rate with nonideal feature extraction and the algorithm of result reliability are illustrated. A specific recognition case of 16 classes of sounds and the test flow of the specific case are given. The results show that the new recognition algorithm can improve the recognition rate greatly.

Keywords

feature extraction; neural nets; pattern recognition; MSCM method; feature extraction; high result reliability algorithm; multiple-set-compete method; pattern recognition; recognition algorithm; recognition rate; Artificial neural networks; Bayes methods; Context; Feature extraction; Pattern recognition; Reliability theory; MSCM; Recognition algorithm; Recognition rate; Result reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Cloud Computing and Intelligent Systems (CCIS), 2012 IEEE 2nd International Conference on

Conference_Location

Hangzhou

Print_ISBN

978-1-4673-1855-6

Type

conf

DOI

10.1109/CCIS.2012.6664313

Filename

6664313