Title :
A stable key generation from PUF responses with a Fuzzy Extractor for cryptographic authentications
Author :
Taniguchi, Masaaki ; Shiozaki, M. ; Kubo, Hiroshi ; Fujino, T.
Author_Institution :
Ritsumeikan Univ., Kusatsu, Japan
Abstract :
Physical Unclonable Functions (PUFs) extract inherent characteristics caused by fabrication process variations, and generate unique challenge-response pairs. Some bits of PUF responses are slightly unstable, then the Fuzzy Extractors (FEs) are used to correct the error bits. This paper proposes the new soft-decision FEs considering the instability caused by voltage fluctuation. We applied this method to our novel RG-DTM PUF fabricated by 0.18 μm CMOS technology. It was demonstrated that the block error rate is reduced to 1/10 compared to the conventional soft-decision FE.
Keywords :
CMOS integrated circuits; cryptography; CMOS technology; PUF response; RG-DTM PUF; block error rate; complimentary metal oxide semiconductor technology; cryptographic authentications; fuzzy extractor; physical unclonable function; size 0.18 mum; soft-decision FE; stable key generation; voltage fluctuation; Authentication; Error analysis; Error correction; Fluctuations; Iron; Voltage fluctuations; Environmental Fluctuation; Fuzzy Extractor; Key Generation; Physical Unclonable Function; Soft-Decision;
Conference_Titel :
Consumer Electronics (GCCE), 2013 IEEE 2nd Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4799-0890-5
DOI :
10.1109/GCCE.2013.6664910
