• DocumentCode
    644537
  • Title

    Ultra-broadband dielectric THz spectroscopy with air-biased-coherent-detection

  • Author

    D´Angelo, Francesco ; Bonn, Mischa ; Turchinovich, Dmitry

  • Author_Institution
    Max Planck Inst. for Polymer Res., Mainz, Germany
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present results on ultra-broadband THz-TDS on silicon using air biased coherent detection (ABCD) technique. We find that the positioning of the sample in the spectrometer, leading to the spatial shift of THz focus, is crucial for accurate spectroscopy results.
  • Keywords
    dielectric devices; elemental semiconductors; radiofrequency spectrometers; silicon; submillimetre wave detectors; terahertz spectroscopy; terahertz wave detectors; ABCD technique; Si; TDS; air biased coherent detection technique; air-biased-coherent-detection; spectrometer; time-domain spectroscopy; ultrabroadband dielectric THz spectroscopy; Lead; Plasma measurements; Plasmas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665505
  • Filename
    6665505