DocumentCode :
644537
Title :
Ultra-broadband dielectric THz spectroscopy with air-biased-coherent-detection
Author :
D´Angelo, Francesco ; Bonn, Mischa ; Turchinovich, Dmitry
Author_Institution :
Max Planck Inst. for Polymer Res., Mainz, Germany
fYear :
2013
fDate :
1-6 Sept. 2013
Firstpage :
1
Lastpage :
2
Abstract :
We present results on ultra-broadband THz-TDS on silicon using air biased coherent detection (ABCD) technique. We find that the positioning of the sample in the spectrometer, leading to the spatial shift of THz focus, is crucial for accurate spectroscopy results.
Keywords :
dielectric devices; elemental semiconductors; radiofrequency spectrometers; silicon; submillimetre wave detectors; terahertz spectroscopy; terahertz wave detectors; ABCD technique; Si; TDS; air biased coherent detection technique; air-biased-coherent-detection; spectrometer; time-domain spectroscopy; ultrabroadband dielectric THz spectroscopy; Lead; Plasma measurements; Plasmas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
Type :
conf
DOI :
10.1109/IRMMW-THz.2013.6665505
Filename :
6665505
Link To Document :
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