DocumentCode
644542
Title
Compact, portable Terahertz systems for on-site inspection applications
Author
Redo-Sanchez, Albert ; Laman, Norman ; Schulkin, Brian ; Tongue, Thomas
Author_Institution
Zomega Terahertz Corp., East Greenbush, NY, USA
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
1
Abstract
This paper describes an example of using a compact Terahertz (THz) system to analyze the layered structure of a composite plastic samples in a non-destructive manner. Time-domain data is analyzed to measure the thickness of each layer of the sample and determine the presence or absence of adhesive bonding the plastic parts. The presence and position of the adhesive is clearly visible in the THz images and the measured thickness shows an excellent agreement with nominal thickness.
Keywords
adhesive bonding; composite materials; inspection; nondestructive testing; plastics; terahertz wave imaging; thickness measurement; time-domain analysis; THz image; adhesive bonding; compact terahertz system; composite plastic sample; layered structure; nondestructive testing; onsite inspection application; portable terahertz system; thickness measurement; time-domain data analysis; Imaging; Inspection; Plastics; Quality control; Slabs; Thickness measurement; Time-domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665510
Filename
6665510
Link To Document