• DocumentCode
    644542
  • Title

    Compact, portable Terahertz systems for on-site inspection applications

  • Author

    Redo-Sanchez, Albert ; Laman, Norman ; Schulkin, Brian ; Tongue, Thomas

  • Author_Institution
    Zomega Terahertz Corp., East Greenbush, NY, USA
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper describes an example of using a compact Terahertz (THz) system to analyze the layered structure of a composite plastic samples in a non-destructive manner. Time-domain data is analyzed to measure the thickness of each layer of the sample and determine the presence or absence of adhesive bonding the plastic parts. The presence and position of the adhesive is clearly visible in the THz images and the measured thickness shows an excellent agreement with nominal thickness.
  • Keywords
    adhesive bonding; composite materials; inspection; nondestructive testing; plastics; terahertz wave imaging; thickness measurement; time-domain analysis; THz image; adhesive bonding; compact terahertz system; composite plastic sample; layered structure; nondestructive testing; onsite inspection application; portable terahertz system; thickness measurement; time-domain data analysis; Imaging; Inspection; Plastics; Quality control; Slabs; Thickness measurement; Time-domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665510
  • Filename
    6665510