Title :
Toward low-NEP room-temperature THz MOSFET direct detectors in CMOS technology
Author :
Pfeiffer, Ullrich R. ; Grzyb, Janusz ; Sherry, H. ; Cathelin, A. ; Kaiser, Alexander
Author_Institution :
IHCT, Bergische Univ. Rainer, Wuppertal, Germany
Abstract :
This paper reports on the impact of antenna impedance frequency characteristics on a broadband low-NEP operation of THz MOSFET direct detectors. New Si-lens integrated high-impedance on-chip ring antennas were developed based on a systematic co-design procedure with MOSFET device. They allowed achieving the world record values both in terms of responsivity and noise equivalent power for detector arrays implemented in a bulk 65 nm CMOS technology. Only few representative design examples out of the complete test array are presented. A peak optical voltage responsivity (Rv) of 2200 and a minimum noise equivalent power (NEP) of 14 pW/√Hz at 200 Hz chopping frequency were measured at 724 GHz for one of the detectors, whereas some other demonstrated broadband operation with an optical NEP below 50 pW/√Hz for at least 650-970 GHz.
Keywords :
CMOS integrated circuits; MOSFET; antennas; silicon; terahertz wave detectors; Si; THz MOSFET direct detectors; antenna impedance frequency characteristics; broadband low-NEP operation; bulk CMOS technology; detector arrays; frequency 200 Hz; frequency 650 GHz to 970 GHz; integrated high-impedance on-chip ring antennas; noise equivalent power; peak optical voltage responsivity; representative design; size 65 nm; systematic co-design procedure; test array; Antenna measurements; Broadband antennas; Detectors; Frequency measurement; Impedance; Optical variables measurement;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location :
Mainz
DOI :
10.1109/IRMMW-THz.2013.6665522