• DocumentCode
    644650
  • Title

    Analysis of CMOS 0.13µm test structures for 0.6 to 1.5 THz imaging

  • Author

    Domingues, Suzana ; Perenzoni, Daniele ; Giliberti, Valeria ; Di Gaspareb, Alessandra ; Ortolani, Michele ; Perenzoni, Matteo ; Stoppa, David

  • Author_Institution
    Center for Mater. & Microsyst, Fondazione Bruno Kessler (FBK), Trento, Italy
  • fYear
    2013
  • fDate
    1-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Test structures comprehending several combinations of FET detector sizes and bow-tie antennas were designed and fabricated in a 0.13 μm standard CMOS technology. Measurement results from these structures provide a quantitative comparison basis for the design of a future real-time high-frame rate THz camera, providing an insight on the optimization of the FET size.
  • Keywords
    CMOS integrated circuits; bow-tie antennas; field effect transistors; terahertz wave imaging; CMOS; FET detector sizes; THz camera; THz imaging; bow-tie antennas; frequency 0.6 THz to 1.5 THz; test structures; Antennas; CMOS integrated circuits; Detectors; Field effect transistors; Frequency measurement; Impedance; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
  • Conference_Location
    Mainz
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2013.6665619
  • Filename
    6665619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=644650