DocumentCode
644681
Title
Terahertz imaging for nondestructive inspection of materials including conductive microparticles
Author
Kurabayashi, Toshiyuki ; Yodokawa, Shinichi ; Kosaka, S.
Author_Institution
Grad. Sch. of Eng. & Resource Sci., Akita Univ., Akita, Japan
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
THz imaging for nondestructive inspection of the materials including conductive microparticles has been studied by use of FDTD analysis and THz spectroscopy. The allocated conductive particles causes the scattering for THz-wave. Though the scattering factor depends on the frequency, a frequency selected wave would be suitable for nondestructive inspection.
Keywords
conducting materials; finite difference time-domain analysis; inspection; nondestructive testing; terahertz wave imaging; terahertz wave spectra; FDTD analysis; THz spectroscopy; THz-wave scattering; conductive microparticles; frequency selected wave; nondestructive inspection; terahertz imaging; Carbon; Films; Finite difference methods; Imaging; Scattering; Time-domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665650
Filename
6665650
Link To Document