DocumentCode
644718
Title
Background corrected transmittance and reflectance measurements in the FIR
Author
Kehrt, M. ; Muller, Rudolf ; Steiger, A. ; Monte, C.
Author_Institution
Phys.-Tech. Bundesanstalt (PTB), Berlin, Germany
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
Transmittance and reflectance measurements with Fourier transform spectrometers in the MIR and FIR can exhibit significant deviations when working with cooled detectors. By measuring at two flux levels and by using an appropriate evaluation scheme systematic deviations can be largely reduced in the range from 25 μm up to 1000 μm.
Keywords
Fourier transform spectrometers; infrared spectroscopy; light transmission; optical variables measurement; reflectivity; Fourier transform spectrometer; background corrected transmittance; far infrared reflectance measurement; far infrared transmittance measurement; wavelength 25 mum to 1000 mum; Detectors; Liquids; Rotation measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665687
Filename
6665687
Link To Document