DocumentCode
644830
Title
Single flange 2-port design for THz integrated circuit S-parameter characterization
Author
Hanning, Johanna ; Stenarson, J. ; Yhland, K. ; Sobis, P. ; Bryllert, Tomas ; Stake, Jan
Author_Institution
Gigahertz Centre, Goteborg, Sweden
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
A single flange 2-port TRL calibration and measurement setup for accurate THz S-parameter characterization of integrated membrane circuit devices is proposed. The proposed setup facilitates shorter access waveguides, which greatly improves the calibration uncertainty.
Keywords
S-parameters; calibration; integrated circuit design; submillimetre wave integrated circuits; terahertz wave devices; waveguides; THz integrated circuit S-parameter characterization; access waveguides; calibration uncertainty; integrated membrane circuit devices; measurement setup; single flange 2-port TRL calibration; single flange 2-port design; Calibration; Fabrication; Flanges; Reflection; Scattering parameters; Standards; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665800
Filename
6665800
Link To Document